Line-Sweep: Cross-Ratio For Wide-Baseline Matching and 3D Reconstruction

Srikumar Ramalingam, Michel Antunes, Dan Snow, Gim Hee Lee, Sudeep Pillai; The IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015, pp. 1238-1246

Abstract


We propose a simple and useful idea based on cross-ratio constraint for wide-baseline matching and 3D reconstruction. Most existing methods exploit feature points and planes from images. Lines have always been considered notorious for both matching and reconstruction due to the lack of good line descriptors. We propose a method to generate and match new points using virtual lines constructed using pairs of keypoints, which are obtained using standard feature point detectors. We use cross-ratio constraints to obtain an initial set of new point matches, which are subsequently used to obtain line correspondences. We develop a method that works for both calibrated and uncalibrated camera configurations. We show compelling line-matching and large-scale 3D reconstruction.

Related Material


[pdf]
[bibtex]
@InProceedings{Ramalingam_2015_CVPR,
author = {Ramalingam, Srikumar and Antunes, Michel and Snow, Dan and Hee Lee, Gim and Pillai, Sudeep},
title = {Line-Sweep: Cross-Ratio For Wide-Baseline Matching and 3D Reconstruction},
booktitle = {The IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2015}
}