Reflectance Hashing for Material Recognition

Hang Zhang, Kristin Dana, Ko Nishino; The IEEE Conference on Computer Vision and Pattern Recognition (CVPR), 2015, pp. 3071-3080


We introduce a novel method for using reflectance to identify materials. Reflectance offers a unique signature of the material but is challenging to measure and use for recognizing materials due to its high-dimensionality. In this work, one-shot reflectance of a material surface which we refer to as a reflectance disk is capturing using a unique optical camera. The pixel coordinates of these reflectance disks correspond to the surface viewing angles. The reflectance has class-specific stucture and angular gradients computed in this reflectance space reveal the material class. These reflectance disks encode discriminative information for efficient and accurate material recognition. We introduce a framework called reflectance hashing that models the reflectance disks with dictionary learning and binary hashing. We demonstrate the effectiveness of reflectance hashing for material recognition with a number of real-world materials.

Related Material

author = {Zhang, Hang and Dana, Kristin and Nishino, Ko},
title = {Reflectance Hashing for Material Recognition},
booktitle = {The IEEE Conference on Computer Vision and Pattern Recognition (CVPR)},
month = {June},
year = {2015}